Upgrade for semiconductor test software will 'speed up' test system integration
Keithley Instruments
KTE Version 5.3
Keithley Instruments has launched an upgrade to its Test Environment semiconductor test software, which it claims will speed up the integration of test systems.
Keithley Instruments has introduced KTE Version 5.3, an upgrade to Keithley Test Environment (KTE) semiconductor test software.
It is designed for use with Keithley’s S530 Parametric Test Systems, a line of process control monitoring systems, and will also, the company claims, speed and simplify the integration of S530 test systems into test floors.
Users of the existing Keithley S400 and S600 Series parametric testers could benefit from using the KTE Version 5.3 on the S530 because existing measurement routines can easily be transported to the S530.
Key facts
- Designed to run on a Linux operating system on a standard industrial PC
- Optimised for use in production parametric test environments
- Keithley claims the upgrade maintains software compatibility with earlier systems
- Simplifies creating new user access point (UAP) source code for conditional test sequencing
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