USB acquisition devices sample faster
National Instruments
USB-6212 and USB-6216
Light and compact devices deliver high-performance I/O for portable USB applications such as field measurements and laptop-based data acquisition.
Two new USB-powered M Series data acquisition (DAQ) devices from National Instruments deliver faster sampling rates and more digital I/O features than previously released bus-powered M Series devices for USB.
The NI USB-6212 and USB-6216 are available with 68-pin SCSI mass termination, screw terminals or 50-pin IDC connectivity to provide multiple connectivity options.
The USB-6212 and USB-6216 enhance the NI USB-621x product offering with a 60% improvement in analogue sampling rates while maintaining high absolute accuracy of 2.7mV at +/-10V and 89uV at +/-200mV.
The devices also provide sixteen 400Ksample/s analogue inputs and two 250Ksample/s analogue outputs, both with 16bit resolution.
These light and compact devices deliver high-performance I/O for portable USB applications such as field measurements and laptop-based data acquisition.
The new devices also feature improved digital I/O by providing more channels, 32bit counters and 32 bidirectional digital lines for screw-terminated devices or 24 bidirectional digital lines for 68-pin devices.
The USB-6212 and USB-6216 mass terminated devices deliver 68-pin cabled connectivity to terminal blocks and custom accessories while 50-pin IDC connectors on OEM devices offers easy board mating for integration in embedded systems.
Additionally, the USB-6216 provides optional 60V CAT I isolation for protection against transient voltages, improved noise immunity and ground-loop removal.
The USB-6212 and USB-6216 are shipped with NI-DAQmx driver software and NI LabView SignalExpress LE, a limited-feature version of the interactive measurement software for quickly acquiring, analysing and presenting data with no programming required.
The NI-DAQmx driver delivers time-saving features such as code generation for both LabView and text-based languages; more than 3,000 measurement examples; device simulation; connection diagrams; and compatibility with LabView, ANSI C/C++, C#, Visual Basic.NET and Visual Basic 6.0.
These devices are fully RoHS-compliant, demonstrating the NI commitment to eliminating certain hazardous substances from products to benefit the environment.
Request more information
More stories
NI launches Multisim 12.0 software for circuit design and electronics education purposesweblink
National Instruments (NI) has launched the latest version of its Multisim 12.0 simulation software, which features specialised editions for circuit design and electronics education.
National Instruments offers early access support for 802.11ac WLAN testingweblink
National Instruments is offering early access support for 802.11ac WLAN device and chipset testing for its software-defined wireless test platform.
National Instruments' remote input/output technology is suitable for embedded controlweblink
National Instruments has launched version 2.0 of its CompactRIO Module Development Kit (MDK) and has introduced remote input/output (RIO) Mezzanine Card, which allow users to add specialised or custom inputs and outputs to packaged and board-level embedded control and monitoring systems.
PXI Express system expansion modules suitable for semiconductor testingweblink
The NI PXIe-8364 and NI PXIe-8374 PXI remote control modules from National Instruments are suitable for use in a range of high-channel-count data acquisition and high-speed automated test applications including RF and semiconductor testing.
CAN and LIN interface modules suitable for automotive testing applicationsweblink
The C Series NI 9861 CAN interface and NI 9866 LIN interface from National Instruments can provide engineers with productivity tools such as hardware-accelerated messaging and onboard processing, and are suitable for automotive testing applications including hardware-in-the-loop simulation and test cell applications




