Nikon unveils all-digital scanners at Control 2010
Nikon
LC60Dx/LC50Cx scanners
Nikon is displaying the LC60Dx scanner, which digitises freeform shapes and supports feature extraction, and the LC50Cx scanner, for inspection and reverse engineering applications, at Control 2010.
The next-generation LC60Dx co-ordinate measuring machine (CMM) laser scanner has evolved from the LC60D scanner and provides laser scanning in the accuracy range of tactile measurement.
The LC60Dx provides a typical MPEp value of 7 microns according to EN ISO 10360-5.
This brings the scanner in the accuracy range of tactile measurement while capturing 75,000 measurement points a second.
The LC60Dx acquires a multitude of measurement points.
The low-cost LC50Cx scanner offers a higher scanning rate and captures surfaces of varying colour and high reflectivity without user interaction.
This all-digital scanner benefits from an upgraded scanning rate of 45 stripes per second and third-generation Enhanced Sensor Performance (ESP3) as incorporated into the LC60Dx.
Through ESP3 technology, LC scanners digitise surfaces with varying colour, high reflectivity or abrupt transitions under any lighting conditions by dynamically adapting laser beam intensity point per point.
The LC50Cx is a low-cost CMM scanner that offers adequate productivity for a range of inspection and reverse engineering applications.
Defining scanner motion paths for a laser scanning inspection job is straightforward compared to the traditional programming of many touch-sensor points.
The company is also presenting a subrelease of its Camio software.
Version 6.3 of the software is said to offer fast data acquisition.
The software features the Fly-by Scanning mode.
Using this mode, the software automatically calculates optimum and continuous scanner motion path curves, resulting in up to 25 per cent faster scanning and simplified programming.
Meanwhile, Focus Inspection 9.2 offers a complete set of functions for digital surface and feature inspection.
It delivers geometric feedback that is essential in tuning final part design and monitors product quality in the fabrication process.
In addition to supporting infinite point-cloud sizes on 64-bit computers, Focus introduces extended language support, Catia V5 file import, enhanced feature extraction and GDandT capabilities compliant with the ASME Y14.5M standard.
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