Datapaq exhibits photovoltaic temperature profiler

Datapaq designed the Solarpaq systems to provide temperature profiling solutions for the contact firing, anti-reflective coating and lamination processes.

These operations are all key to the quality and performance of the photovoltaic cell and hence, module.

The Solarpaq system travels through the furnace or thermal process, measuring a time-temperature profile directly from the product.

The Solarpaq anti-reflective coating system provides temperature profiles from the solar cells as they pass through the silver nitride coating process.

This is typically conducted using a plasma sputtering process and users can now monitor the cell temperature profile even with the plasma energised.

This system has been designed so that it simply takes the place of one of the cells in the carrier, thus no modification is required to the expensive carrier.

Incorporating feedback from process engineers using the Datapaq profiling system in contact firing furnaces, the Solarpaq contact firing cell clamp is paired with custom-designed thermocouple probes to ensure accurate and repeatable measurements.

The Solarpaq vacuum lamination system is used to profile the final assembly stage of the solar modules.

A thermal barrier ensures that the data logger is protected from not only the heat of the lamination process, but also the external pressure that is applied.

An external barrier frame eliminates the risk of any stress points being created on the vacuum membrane.

Routine temperature profiling gives reliable data to optimise a process, prove process control and make corrections when required.

The new Datapaq products will also be displayed at the Solarpeq/Glasstec exhibition in Dusseldorf, Germany, from 28 September to 1 October 2010.