Lambda Photometrics offers non-contact multilayer film thickness measurement
Lambda Photometrics
MProbe
Lambda Photometrics has introduced the MProbe non-contact film thickness measurement system, which uses spectroscopic analysis to measure the thickness of translucent multi-layer film stacks.
According to the company, MProbe is suitable for a number of at-line, on-line and OEM applications, as well as academic and industrial research and development.
Typical applications include polymer films, solar-cell PV coatings, semiconductors, thin oxide and nitride films, photoresists, LCD and flat-panel displays and optical coatings.
Lambda Photometrics’ range of MProbe systems is available for both UV and IR applications and satisfy a wide range of thicknesses and resolution requirements.
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