Keithley Instruments offers webinar on NVM characterisation and measurement techniques
Keithley Instruments
NVM webinar
Keithley Instruments is going to broadcast a free, web-based seminar titled ‘Non-volatile memory — characterisation and measurement techniques’ on Thursday 17 November 2011.
The company recommends this webinar primarily for NVM test engineers, researchers and test-engineering managers, but claims it will be useful for any engineer or researcher/student in the NVM field.
During the course of the seminar participants will learn about common characterisation and measurement techniques for a variety of established and emerging NVM technologies, including flash, PRAM, ReRAM and FeRAM.
The webinar will also feature an overview of instrumentation that combines pulse source and measurement in a single instrument, which measures the current and voltage simultaneously while applying multi-pulse waveforms to a memory device or material.
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