Webinar to discuss ultra-fast I-V characterisation

The one-hour seminar will explore the increasing importance of ultra-fast current-voltage (I-V) characterisation across range of device and process technologies.

Ultra-fast I-V testing, which includes pulsed I-V, transient I-V and pulsed sourcing testing, is of increasing importance in the development of semiconductor materials, processes and devices, according to the company.

Common applications include non-volatile memory (NVM) devices such as Flash and phase change memory, the isothermal characterisation on silicon-on-insulator (SOI) devices and compound semiconductors and the transient characteristics of new materials such as high-K dielectrics.

The webinar will incorporate a core description of the measurement hardware and setups, including cabling to a probe station.

It will also discuss typical uses and test setups as well as common error sources.

Finally, some practical examples of device measurements will be given.

The seminar is recommended for students, researchers and engineers involved in the characterisation of materials, processes and devices.

It will also be useful for laboratory managers wanting to learn about this measurement technique and engineers conducting device and material reliability studies (WLR, ESD and latch-up, for instance).

The 'Fundamentals of Ultra-Fast I-V Device Characterization' webinar will be presented by Lee Stauffer, senior staff technologist for Keithley Instruments' Semiconductor Measurements Group based in Cleveland, Ohio.

Prior to joining Keithley, Stauffer's career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.

The event is free to the public, but participants must register in advance at http://www.keithley.info/ultrafastIVa.