Nanotechnology test library now available on CD
Keithley Instruments
Nanotechnology Technical Test Library CD
Keithley Instruments has released a CD containing technical papers, articles, data sheets and links to online seminars covering a wide range of nanotechnology test applications.
The Nanotechnology Technical Test Library CD is helping to advance electrical measurements in applications that reveal important parameters of nanoscale semiconductor devices and materials, carbon nanotubes, Hall-effect devices, materials with non-linear resistance and many others.
The test and measurement solutions featured on the CD are organised by type of instrument and include: current sources, electrometers and picoammeters, integrated source/measure instruments, nanovoltmeters, parametric analysers and pulse/pattern generators.
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E-handbook on nanoscale electrical measurements
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Keithley CD offers electrical measurement advice
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Keithley CD offers electrical measurement advice
Keithley Instruments has released a tutorial CD that offers practical techniques for obtaining the most accurate and precise measurements possible.
Webinar to discuss ultra-fast I-V characterisation
Keithley Instruments will broadcast a free, web-based seminar, entitled 'Fundamentals of Ultra-Fast I-V Device Characterization', on 29 April 2010 at 15:00.
Keithley considers ultra-fast I-V applications
Keithley Instruments has created an interactive applications overview, entitled 'Ultra-Fast I-V Applications'.
