Debug/analysis tool for embedded systems designers

The TLA6000 Series delivers performance and functional capability previously only found on the high-performance TLA7000 Series of instruments at a much lower price point, while offering more capabilities than the portable TLA5000 Series models.

Higher signal speeds and increased board densities often lead to signal integrity issues such as crosstalk, ground bounce and ringing that manifest themselves in functional failures of the digital system.

The TLA6000 Series gives engineers a complete toolset to help them quickly find, isolate and debug these hard-to-isolate issues.

Intended to meet demand for more performance among embedded engineers, the TLA6000 Series is available in 68, 102 and 136 digital channel configurations with 125ps high-speed timing on all channels - up to 450MHz state timing and up to 128Mb record length.

The TLA6000 Series enhances engineering productivity with advanced features such as iCapture multiplexing that eliminates double probing with simultaneous digital and analogue acquisition through a single logic analyser probe.

Glitch trigger and storage allows users to trigger on and display observed signal integrity faults, while the iView display provides a time-correlated view of logic analyser and oscilloscope data on the same display.

Simple and intuitive instrument setup saves time in busy lab environments with accelerated design cycles.

The TLA6000 Series is suited for a range of debug and analysis applications, including signal integrity analysis, FPGA debug and verification, MIPI protocol analysis, memory system validation, and embedded software integration and debug.