Spectrometer removes compliance risks
Fischer Instrumentation
XAN spectrometer
The Fischer XAN spectrometer is being used by companies such as RS Components and Technetix for RoHS compliance screening.
Compliance with the RoHS and WEEE directives is important for most manufacturing or importing companies, and reliance on certificates provided by remote suppliers may be too much of a risk.
The Fischer XAN spectrometer is being used by companies such as RS Components and Technetix for RoHS compliance screening, due to its versatility and range of small collimators, which go down to 0.2mm.
Small collimators are essential for screening electronic components as materials commonly used in ceramic capacitors, glass diodes etc, are allowed to contain Lead (Pb) and therefore will give a false positive.
It is necessary to evaluate only the end connections or solder joints.
The detection limit of lead mercury and bromine, is below 10ppm and for cadmium and chromium, below 20ppm.
Request more information
More stories
Data sheet: Fischer Instruments' Betascope for coating-thickness measurementsdownload
Fischer Instruments’ Betascope can be used to make coating-thickness measurements and material-reference measurements.
Data sheet: Fischer Instruments' Picodentor HM500download
Fischer Instruments has launched the Picodentor HM500 for the micro-hardness measurement of coatings in the nanometer range.
Product brochure: Dualscope MP0 measures coating thickness over ferrous and non-ferrous metalsdownload
Fischer Instrumentation’s Dualscope MP0 measures coating thickness over ferrous and non-ferrous metals.
Product brochure: Phascope PMP10 measures coating thickness on PC boards and electroplated surfacesdownload
Fischer Instrumentation’s Phascope PMP10 measures coating thickness on PC boards and electroplated surfaces.
Product brochure: Phascope PMP10 Duplex for measuring the thickness of duplex coatingsdownload
Fischer Instrumentation’s Phascope PMP10 Duplex is a hand-held instrument for measuring the thickness of duplex coatings.





