Keithley Instruments launches semiconductor characterisation system upgrade
Keithley Instruments
Keithley Instruments, an electrical test instruments and systems firm, has launched the Keithley Test Environment Interactive (KTEI) V8.2 upgrade for its Model 4200-SCS semiconductor characterisation system.
The upgrade includes non-volatile memory (NVM) test libraries and sample projects for a variety of emerging memory technologies.
The upgrade also supports making very low frequency capacitance-voltage (C-V) measurements, which are useful for characterising device technologies such as polymer electronics, organic LEDs (OLEDs), and OLED-based displays.
In addition, KTEI V8.2 supports Model 4200-SCS system configurations with ultra-fast current-voltage (I-V) test modules.
Key features
- The NVM test libraries included in KTEI V8.2 expand the system’s capabilities for testing all types of non-volatile memory devices, including flash, phase change memory (PRAM and PC-RAM), resistive memory (RRAM or ReRAM), and magnetoresistive (MRAM) memory devices
- KTEI V8.2 provides a common set of test libraries for testing the various NVM technologies while incorporating the measurement hardware requirements associated with each
- The test libraries are designed to build on the capabilities provided in two of the newest hardware options for the Model 4200-SCS, the Model 4225-PMU ultra-fast I-V Module, and the Model 4225-RPM remote amplifier/switch module
- Includes a new patent-pending technique for making very low frequency capacitance-voltage (VLF C-V) measurements with the system’s DC SMUs and low current remote pre-amplifier that allows measuring device capacitance and resistance at frequencies from 10Hz down to 10mHz
- The Model 4200-SCS system can support up to six Model 4225-PMU modules in its nine-slot chassis.
- By boosting the maximum number of Model 4225-PMU modules the Model 4200-SCS can support, KTEI V8.2 expands the system’s ability to characteriae multiple devices by testing them in parallel
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