Signal generators for digital datacom applications
Anritsu
RF/microwave signal generators
Anritsu has introduced the MG3690C series of RF/microwave signal generators for testing microwave components, subsystems as well as verifying radar and communications systems.
The company said the signal generators combine good phase noise and broad frequency generation to allow engineers to conduct highly accurate tests on subsystems, especially those in local oscillator substitution and clock-generation applications.
The overall performance of the MG3690C signal generators is said to make them suitable to test microwave components, subsystems, and systems during design and manufacturing, as well as for signal stimulation to test and verify radar and communications systems.
The MG3690C is the latest member of the company's synthesiser family that generates signals from 0.1Hz to 70GHz.
Baseband, IF, RF, and microwave signal can be produced from a single instrument to maximise equipment use and reduce cost of test.
Options set a new level for low phase noise of -115dB/Hz at 20GHz and 10kHz offset.
This means that devices under test (DUT) are stimulated with known good signals, therefore enhancing the integrity of the measurement and reducing time tracking down test-equipment-induced measurement problems.
The series is also said to be ideal for digital datacom applications, as the low phase noise minimises instrument-induced clock jitter.
The MG3690C can generate narrow pulses down to 10ns to emulate a variety of signals.
Amplitude-levelled pulses down to 100ns can be generated to minimise amplitude drift over time and temperature for tight test margins.
Amplitude-levelled pulses also eliminate the need for a CW mode during frequency change and minimise the chances of the DUT becoming damaged.
The MG3690C series can generate doublet, triplet and quadruplet pulses with independently set spacing and pulse width, making the signal generators well suited to emulate a range of radar returns.
The signal generators also deliver high measurement speed, as their fast switching speed of 5ms reduces test time.
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