Keithley to hold Hall Effect measurement webinar
Keithley Instruments
Hall Effect measurement webinar
Keithley Instruments will broadcast a free, web-based seminar entitled 'Hall Effect Measurements Fundamentals' on 19 February.
This one-hour seminar will introduce the topic of Hall Effect measurements as they relate to semiconductor materials and device characterisation.
Hall Effect measurement systems are commonly used to determine semiconductor parameters, such as carrier mobility and concentration, Hall coefficient, and conductivity and conductivity type.
Seminar participants will learn what Hall Effect measurements are, who can use them, what industry trends are driving the need for them, and what key equipment considerations are involved in configuring Hall Effect measurement systems.
The event will conclude with a text-based QandA session.
This seminar is recommended for engineers and materials scientists developing thin films for solar/photovoltaic applications, as well as for those new to semiconductor materials and testing, anyone working with compound semiconductor materials, and characterisation lab managers.
Steven Weinzierl, Keithley's applications engineering manager, will present the seminar.
More stories
Nanotechnology test library now available on CD
Keithley Instruments has released a CD containing technical papers, articles, data sheets and links to online seminars covering a wide range of nanotechnology test applications.
Keithley releases Model 3732 Quad 4x28 matrix card
The Model 3732 Quad 4x28 ultra-high density reed relay matrix card is for automated switch and measure applications requiring multiple instrument connections and high-crosspoint density and speed.
Lecroy selects Keithley RF/microwave switch system
Lecroy has selected Keithley Instruments' System 46 (S46) RF/microwave switch system as part of the original equipment for its USB 3.0 Test Suite product family.
Keithley webinar to focus on PV measurements
Keithley Instruments is to broadcast a free web-based seminar, entitled 'Photovoltaic Measurements: Testing the Electrical Properties of Today's Solar Cells', on 27 May 2009.
White paper describes semiconductor technologies
Keithley Instruments has published a white paper on how semiconductor characterisation and parametric test solutions are evolving to keep pace with changes in the semiconductor industry.
