Goepel expands Scanflex platform by controllers

The company said the multifunctional controller enables the combination of numerous strategies for testing, programming and design validation, and is ready to support new and upcoming standards, such as IEEE 1149.7 and chip-embedded instrumentation (IEEE P1687).

High scalability and future reliability are ensured by the integrated hardware extension slots.

The controller's multi-functionality enables users to program Flash and PLD drives quickly.

In addition, they can achieve higher test quality by combining most modern technologies, such as processor emulation test, high-speed I/O test, protocol-driven interface test and the utilisation of chip-embedded instruments.

The SFX/Combo1149-(x) controller series provides USB2.0 and Gbit LAN interfaces, including three models of different performance classes to be configured by software, enabling TCK frequencies of up to 80MHz.

Four integrated test access ports (TAPs) can be programmed by a multitude of parameters and adjusted flexibly to the unit under test (UUT).

Furthermore, the controllers feature dynamic I/O channels, analogue I/O and altogether three extension slots to connect SFX modules.

These modules can be utilised to complement the analogue or digital functional hardware range.

On this basis, SFX/Combo1149 is able to support all standardised test and programming techniques such as IEEE 1149.x or IEEE 1532, and many other methods, such as processor emulation test, high-speed I/O test, protocol-based interface tests and chip-embedded instruments.

This flexibility is said to enable higher test coverage and improved fault diagnostics, savings in separate instruments and additional process steps, therefore reducing production costs.

The SFX/Combo1149-(x) controller series is fully supported by the JTAG/boundary scan platform system Cascon from v4.5.4 on.