XJTAG supports Micron Omneo Phase Change Memory

PCM enables enhanced system performance and is programmed in situ after the board is assembled.

XJTAG, working with Micron, has developed a solution to program PCM at close to its maximum programming speed using the XJTAG boundary scan system.

It will allow customers to program PCM quickly on production lines or in development labs.

This builds on XJTAG's XJFlash solution for high-speed programming of Flash memories.

'PCM is a new memory technology that combines the best attributes in NOR, NAND and DRAM,' said Jeff Bader, senior director of marketing for Micron's embedded group.

The XJTAG boundary scan system is used for development or production, offering features such as a high-level test-description language, graphical application to help engineers visualise their circuits and automated connectivity tests and DFT analysis.

XJTAG's software calculates how to utilise the boundary scan chain to maximise test coverage and accelerate programming of devices such as memories and PLDs.

Used in conjunction with the XJTAG boundary scan debug, test and programming system, XJFlash can be used to program and verify PCM devices provided there is an FPGA or CPU on the target board and this is connected up to the JTAG chain correctly.

'With this enhancement to the XJTAG system, we can now provide high-speed programming for Micron PCM devices,' said Simon Payne, chief executive, XJTAG.

'This means that engineers designing complex boards containing BGA, FPGA and flash devices can do away with a separate flash programmer and utilise the full power of the XJTAG system to debug, test and program their designs throughout the product lifecycle,' he added.