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NI software suite tests Mobile Wimax devices

National Instruments

Measurement Suite for Mobile Wimax

NI has introduced a software suite that engineers can use with modular RF instrumentation for automated testing of Mobile Wimax devices.

Based on PXI Express instrumentation powered by multicore technology, the suite can perform error vector magnitude (EVM), power and spectral measurements three to five times faster than traditional instruments, according to the company PXI Wimax test systems also provide a low-cost, RandD-grade instrumentation alternative to traditional instruments.

The suite has a typical residual EVM accuracy of -46dB at 3.5GHz (-10dBm).

It supports channel bandwidths from 1.25 to 28MHz and fast Fourier transform (FFT) sizes 128, 256, 1024 and 2048, as well as all Mobile Wimax modulation types with convolution coding and turbo-convolution coding.

The Measurement Suite for Mobile Wimax can also generate or analyse signals with up to eight zones and 16 bursts.

Combined with the NI PXIe-5663E RF vector-signal analyser and NI PXIe-5673 RF vector-signal generator, the measurement suite also provides continuous frequency coverage from 85MHz to 6.6GHz.

By including the NI Signal Analysis Toolkit and the NI Signal Generation Toolkit for Mobile Wimax, the suite offers programming APIs and virtual instrument panels for signal generation and analysis in programming environments, including the NI Labview graphical system-design platform.

In addition to a Labview API, the toolkits install with an equivalent C-style API for engineers using C, C++, .NET, or similar programming language.

The suite for Mobile Wimax supports multiple PXI hardware configurations to meet different application needs.

A standard NI test bundle for Mobile Wimax includes an NI PXIe-5663 6.6 GHz vector-signal analyser, NI PXIe-5673 6.6GHz vector-signal generator, NI PXIe-1075 18-slot high-bandwidth chassis and an NI PXIe-8108 dual-core controller to provide high-performance flexibility to a variety of automated test systems.

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