Keithley updates semiconductor test software

ACS Basic Edition Version 1.2 enables the characterisation of component or discrete (packaged) semiconductor devices.

It features a trace mode that allows an instantaneous check of results and interactively controls voltage sweeps to avoid impending device breakdown.

In addition to full support for Keithley's line of source-measure (SMU) instrumentation, ACS Basic Edition combines high-speed hardware control, device connectivity and data management in a tool that is optimised for part verification, debugging and analysis.

ACS Basic Edition a set of quick and easy-to-access test libraries, so no programming is needed.

An intuitive GUI further simplifies many types of I-V testing, data collection and analysis.

Even novice users can test a semiconductor component in seconds, generate a family of curves and then compare them with reference curves immediately.

While pre-configured tests minimise startup time, the user still has the flexibility to optimise a test or the entire test system.

The Trace Mode feature of ACS Basic Edition Version 1.2 supports interactive testing of a device.

It can be used to map out the operating range and characteristics of a DUT while avoiding damage to the device.

This interactive mode includes a convenient method of controlling the voltage level of a sweep with either a virtual slide bar or the arrow keys on a PC keyboard.

ACS Basic Edition maximises productivity for technicians and engineers responsible for packaged part characterisation in applications ranging from early device research to development, quality verification and failure analysis.

It will serve university researchers and developers of novel devices, aiding in the transition from pure research to commercial application.

It can also be used in semiconductor facilities and companies involved in pilot production for process refinement at the component level, supporting engineers involved in QA, failure analysis and post-production testing.