FME launches Batboard evaluation kit

The Batboard - based on the Charge-mode Interleaved Sampler technology (CHAIS) - allows early silicon characterisation of a two-channel 56GSa/s 8-bit ADC using the single-chip Robin device, the first customer evaluation silicon for CHAIS technology, fabricated on Fujitsu's standard 65nm CMOS technology.

The evaluation kit will be shown to customers for the first time at this year's OFC Conference in San Diego at the end of March.

According to FME, the Batboard achieves a high level of performance for the sampling of high-speed signals for evaluation purposes and is suitable for prototyping next-generation test and measurement systems.

Two delay matched channels are each sampled at 56GSa/s by the Robin chip.

The captured 8-bit ADC signals are stored on chip in the memory, allowing data access at low speed via USB.

Several trigger options are available, enabling the capture of transient events such as data edges and glitches.

Low-loss material, suitable for lead-free assembly in high-reliability applications, has been used in the multi-layer PCB design for signal integrity.

Neil Amos, director of the communications business unit at FME, said: 'With the Batboard, our customers can gain early access to our leading-edge ADC technology with an easy-to-use demonstrator that helps them solve the difficult problems of high-speed signal acquisition.

'The evaluation kit allows customers to prototype new high-end test systems, optical front-ends with breakthrough performance levels and enables them to do forward-looking research,' he added.

The Batboard evaluation kit contains an evaluation board, a single-ended to dual-channel differential signal splitter, a PC-USB interface and associated software.

It is offered in two versions, with the Robin chip either soldered to the PCB or mounted in a high-bandwidth socket.