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National Instruments offers RIO devices for high-volume monitoring and control tasks weblink
National Instruments has further expanded its reconfigurable I/O (RIO) platform with what it claims is its smallest single-board RIO device yet and a multicore Compact RIO system.
PXI modules used within automatic test systems to simulate common fault conditions
Pickering Interfaces is expanding its range of PXI Fault Insertion modules, which are used within automatic test systems to simulate common fault conditions such as open, short-to-ground or short-to-other connections in a device under test.
National Instruments opens technical paper contest
National Instruments has announced a graphical system design case study contest and invited engineers and scientists to share how they are utilising the company's products in their applications.
Counter timers aimed at panel builders and OEMs
Switchtec has introduced H7E counter timers from Anly, offering users monitoring facilities in control panels and other equipment where lapsed time or events must be recorded.
TME offers CRT-V1 timer from Cobi Electronic
TME is offering the CRT-V1 timer from Cobi Electronic, which offers 16 universal time functions and can operate in a delta-star switch, crosspoint switch or automatic landing switch configuration.
Open-source project provides IEEE training
Goepel Electronic has announced the accession to the goJTAG initiative, which is the first university-driven open-source project aimed at providing a full package for a JTAG/Boundary Scan newcomer.
Peak Test Services introduces short-travel probe
The P909 Series from Peak Test Services is a short-travel probe for battery contact applications.
Waveform generators for electronic device testing
Tabor Electronics has released its Wavexciter series of high-speed arbitrary waveform generators for electronic test applications.
Signal generators for digital datacom applications
Anritsu has introduced the MG3690C series of RF/microwave signal generators for testing microwave components, subsystems as well as verifying radar and communications systems.
Mod5 Flip-Top Socket for 0.5mm-pitch BGA devices
The Mod5 Flip-Top BGA Socket provides a compact, surface-mount test solution for micro-BGA chipsets used in applications such as handheld, mobile and wireless product development.
Suppliers
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National Instruments video article
National Instruments transforms the way engineers and scientists around the world design, prototype and deploy systems for test, control and embedded design applications. Using NI LabVIEW graphical programming software and modular hardware, customers at more than 30,000 companies annually ...
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Goepel Electronic video article
GOEPEL electronic GmbH
