ATE systems
Automated or automatic test equipment systems.
Product & Service Resources
Peak tool detects blocked or tight plungers in the probes used in automatic test equipment
Peak Test Services has introduced a tool designed to detect blocked or tight plungers in the test probes used in automatic test equipment (ATE).
Isabellenhutte offers current measurement modules
Isabellenhutte Heusler’s new IPC series of current measurement modules is designed to control a range of electric high-performance motion control units.
Goepel expands Scanflex platform by controllers
Goepel Electronic has introduced the SFX/COMBO1149-(x), said to be the first desktop compact controller within the framework of the boundary scan hardware platform Scanflex.
DC e-loads save rack space in ATE applications
Safety Power Group has introduced a range of air-cooled programmable DC electronic loads (e-loads) that offer a small footprint to save rack space in automatic test equipment (ATE) applications.
Nanotechnology test library now available on CD
Keithley Instruments has released a CD containing technical papers, articles, data sheets and links to online seminars covering a wide range of nanotechnology test applications.
Keithley releases Model 3732 Quad 4x28 matrix card
The Model 3732 Quad 4x28 ultra-high density reed relay matrix card is for automated switch and measure applications requiring multiple instrument connections and high-crosspoint density and speed.
Lecroy selects Keithley RF/microwave switch system
Lecroy has selected Keithley Instruments' System 46 (S46) RF/microwave switch system as part of the original equipment for its USB 3.0 Test Suite product family.
Stantronic launches G5100A waveform generator
Stantronic Instruments has introduced the G5100A arbitrary function generator from Picotest.
Keithley webinar to focus on PV measurements
Keithley Instruments is to broadcast a free web-based seminar, entitled 'Photovoltaic Measurements: Testing the Electrical Properties of Today's Solar Cells', on 27 May 2009.
White paper describes semiconductor technologies
Keithley Instruments has published a white paper on how semiconductor characterisation and parametric test solutions are evolving to keep pace with changes in the semiconductor industry.
